Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos
نویسندگان
چکیده
منابع مشابه
Stochastic Testing Method for Transistor-level Uncertainty Quantification
Design and fabrication uncertainties have become an important issue in nano-scale integrated circuit design. Such uncertainties are typically randomly distributed, as described by probability density functions extracted from measurements. Such device-level uncertainties can propagate to the upper circuit level, leading to significant variations in circuit performances (such as power dissipation...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2013
ISSN: 0278-0070,1937-4151
DOI: 10.1109/tcad.2013.2263039